BEGIN:VCALENDAR PRODID;X-RICAL-TZSOURCE=TZINFO:-//Calagator//EN CALSCALE:GREGORIAN X-WR-CALNAME:Calagator METHOD:PUBLISH VERSION:2.0 BEGIN:VTIMEZONE TZID;X-RICAL-TZSOURCE=TZINFO:America/Los_Angeles BEGIN:DAYLIGHT DTSTART:20100314T020000 RDATE:20100314T020000 TZOFFSETFROM:-0800 TZOFFSETTO:-0700 TZNAME:PDT END:DAYLIGHT END:VTIMEZONE BEGIN:VEVENT CREATED;VALUE=DATE-TIME:20100327T212604Z DTEND;TZID=America/Los_Angeles;VALUE=DATE-TIME:20100331T190000 DTSTART;TZID=America/Los_Angeles;VALUE=DATE-TIME:20100331T180000 DTSTAMP;VALUE=DATE-TIME:20100327T212604Z LAST-MODIFIED;VALUE=DATE-TIME:20100327T214714Z UID:http://calagator.org/events/1250458484 DESCRIPTION:Title: The Impact of Resonant\, Distributed\, Frequency and T ransmission Properties of Interconnects upon Nano-Scale VLSI Devices Rel iability and Functionality \;\nSpeaker: Pavel Livshits\, Bar Ilan Uni versity\, Israel \;\nWhen: Wednesday\, March 31\, 2010\, 5:30 – 7:00p m \;\nWhere: U Portland\, Shiley Hall 124 \;\nDirections: See http ://www.up.edu/about/default.aspx?cid�07&\;pid177 \;\nFood: Pizza and Soda \;\nRSVP: Requested - register at http://meetings.vtools.ie ee.org/meeting_registration/register/1991 \;\n \;\nPavel Livshits from Bar Ilan University\, Israel will present some of the findings of h is doctoral research. \;\n \;\nAbstract: \;\n Rapid development of Systems-on-a-Chip (SoC) over the last decade has set tougher signal integrity requirements for on-die signal and power distribution networks . At the same time\, only a very few experimental works have been conduc ted to study the properties of on-die interconnects constituting these n etworks. \;\nIn this talk\, results obtained within the framework of our experimental study on global interconnects\, constructed as transmi ssion lines\, that carry out on-die global signaling and on interconnect s constituting power supply and ground grids\, are presented. In the stu dy we employed VLSI engineering samples typical for 90 nm and 45 nm CMOS technology nodes. \;\nWe found that local voltage fluctuations in p ower supply and ground grids\, excited by on-die logic cell switching ha ve a resonant-like form. This finding resolves the discussed in literatu re controversy over the need for considering parasitic inductance i.e.\, the on-die power grids should be described as an RLC circuit. \;\nW e experimentally observed and confirmed by modeling that the active elem ent (i.e.\, CMOS logic cell) influences the frequency properties of powe r supply and ground grids during its switching (as opposed to before or after switching). Thus\, it was shown that frequency properties of both grids are inter-related via the interconnecting active elements. \;\ nIn our experimental study was found that the impedance matching between CMOS driver and a driven transmission line\, and the Ohmic losses of on -die transmission lines\, implemented by standard metal layers of modern technology nodes\, play an important role in circuits’ performance. The study suggests that impedance mismatch results in excessive power consu mption and signal integrity problems. The high Ohmic losses result in a significant distortion and Inter-Symbol Interference of already a few hu ndreds Mega-Hertz signals. \;\nOur study reveals that relatively low but repetitive voltage oscillations on on-die power supply and ground g rids\, excited by logic cells switching\, may lead not only to logic fau lts\, as it has been regarded\, but also to an accumulated damage of VLS I MOSFETs. Thus\, according to Berkley Reliability Tools models simulati ons they accelerate the device degradation due to three main wearout mec hanisms\, such as Time-Dependent Dielectric Breakdown\, Negative Bias Te mperature Instability and Hot Carrier Injection. The similar device dama ge\, as the study shows\, is caused by the impedance mismatch induced di stortions of signals supplied to input of on-die CMOS logic cells. \; \n \;\n \;\nSpeaker(s): Pavel Livshits\, \;\n \;\nAgenda: & #13\;\nWednesday\, March 31\, 2010\, 5:30 – 7:00pm \;\n \;\n \; \nLocation: \;\nRoom: 124 \;\nBldg: Shiley Hall \;\nUniversity of Portland \;\n5000 N. Willamette Blvd. \;\nPortland \;\n9720 3\n\nImported from: http://calagator.org/events/1250458484 SUMMARY:IEEE - The Impact of Resonant\, Distributed\, Frequency and Trans mission Properties of Interconnects upon Nano-Scale VLSI Devices Reliabi lity and Functionality LOCATION:University of Portland\, Shiley Hall\, Room 124: 5000 N. Willame tte Blvd.\, Portland Oregon 97203 US SEQUENCE:4 END:VEVENT END:VCALENDAR